The Nile on eBay FREE SHIPPING UK WIDE Introduction to IDDQ Testing by Paul J. Thadikaran, S. Chakravarty
This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
FORMATPaperback LANGUAGEEnglish CONDITIONBrand New Publisher Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Table of Contents
1 Introduction.- 2 Why IDDQ Testing?.- 3 Putting IDDQ Testing to Work.- 4 Physical Defects.- 5 Test Suites, Fault Models, Test Sets and Defects.- 6 Evaluating IDDQ Tests.- 7 Selecting IDDQ Tests.- 8 Computing IDDQ Tests.- 9 Fault Diagnosis.- 10 Instrumentation for IDDQ Measurement.- References.
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Long Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Details ISBN1461378125 Author S. Chakravarty Language English Edition 97199th ISBN-10 1461378125 ISBN-13 9781461378129 Media Book Short Title INTRO TO IDDQ TESTING SOFTCOVE Series Frontiers in Electronic Testing Series Number 8 Year 2012 Publication Date 2012-10-12 Imprint Springer-Verlag New York Inc. Place of Publication New York, NY Country of Publication United States Illustrations XIX, 323 p. AU Release Date 2012-10-12 NZ Release Date 2012-10-12 US Release Date 2012-10-12 UK Release Date 2012-10-12 Pages 323 Publisher Springer-Verlag New York Inc. Edition Description Softcover reprint of the original 1st ed. 2002 Format Paperback Alternative 9780792399452 DEWEY 620.00420285 Audience Professional & Vocational We've got this
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