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Research Handbook on Knowledge Transfer and International Business by Zaheer Kha

By Zaheer Khan, Smitha R. Nair, Yong K. Lew. Technological overlap and cultural distance in MNCs' location choiceof technological clusters in China 159Shuna Shu Ham Ho and Chang Hoon Oh9. -- Pervez Ghauri, University of Birmingham, UK.

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ConditionBrand New
FormatPaperback
ISBN-139781035322046
AuthorZaheer Khan, Smitha R. Nair, Yong K. Lew
TypeNA
Book TitleResearch Handbook on Knowledge Transfer and International Busines
Publication NameNA
ISBN9781035322046

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