Principles of Materials Characterization and Metrology by Kannan M. Krishnan (En

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This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

FORMATPaperback LANGUAGEEnglish CONDITIONBrand New Publisher Description

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids,and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions thatdetermine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopyand scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of thedifferent spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test thereader's knowledge with extensive questions and exercises.

Author Biography

Kannan M. Krishnan graduated from the Indian Institute of Technology, Kanpur and earned his Ph.D. from University of California, Berkeley (UCB) in 1984. He is currently Professor of Materials Sciences and Physics at the University of Washington (UW). He is a Fellow of the American Physical Society, the Institute of Physics (London), the American Association for the Advancement of Science, and the Institute of Electrical and Electronics Engineers (IEEE). He hasreceived the Burton Medal (MSA), the Fink Prize (IEEE), the Guggenheim and Rockefeller fellowships, a Fulbright Specialist award, the Distinguished Engineer/Scientist award (TMS) and the Alexander vonHumboldt Research Award, and has been elected a member of the Washington State Academy of Sciences. With visiting appointments at institutions in all six continents and multiple teaching awards at UCB, UW and professional societies (IEEE Magnetics Distinguished Lectureship), he is widely recognized for his role in education.

Table of Contents

1: Introduction to materials characterization, analysis, and metrology2: Atomic structure and spectra3: Bonding and spectra of molecules and solids4: Crystallography and diffraction5: Probes: sources and their interactions with matter6: Optics, optical methods, and microscopy7: X-ray diffraction8: Diffraction of electrons and neutrons9: Transmission and analytical electron microscopy10: Scanning electron microscopy11: Scanning probe microscopy12: Summary tables

Review

An excellent book for graduate students and early career researchers ..., one of the best to review the present status of Materials Science. Strongly recommended. * Nobuo Tanaka, Nagoya University, Japan *Very timely and of paramount importance to both students and senior researchers. * Peter Fischer, Lawrence Berkeley National Lab *Comprehensive, well organized, and should appeal as a fundamental text to a wide range of first and second year undergraduates studying Materials Science, Engineering, Physics, Chemistry or Geology. * David Cardwell, University of Cambridge *Materials characterization is at the core of what Materials Scientists and Engineers do, and this book strikes a fine balance between fundamentals and applications for the different techniques. * Juan Claudio Nino, University of Florida *This is an excellent textbook for a course on the structural characterisation of materials. It could also find a place on the bookshelf of an experienced materials scientist wanting to be brought up to date on new techniques and their applications. * A.H. Harker, Contemporary Physics *

Promotional

This book provides a comprehensive introduction to the principles of materials characterization and metrology.

Long Description

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids,and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics,optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide aconvenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Review Quote

Very timely and of paramount importance to both students and senior researchers.

Feature

Goes well beyond characterization, as the techniques are also used to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approachKey points and features of the techniques presented throughout the book are summarised in easy-to-read tablesSummaries highlight important information covered, worked examples help consolidate information, test-your-knowledge questions helps understanding of information presented in the text, and problems motivate students to hone their skills.Helps readers learn the principles of characterization by building on their knowledge of elementary chemistry, physics, and materials science.

New Feature

1. Introduction to materials characterization, analysis, and metrology 2. Atomic structure and spectra 3. Bonding and spectra of molecules and solids 4. Crystallography and diffraction 5. Probes: sources and their interactions with matter 6. Optics, optical methods, and microscopy 7. X-ray diffraction 8. Diffraction of electrons and neutrons 9. Transmission and analytical electron microscopy 10. Scanning electron microscopy 11. Scanning probe microscopy 12. Summary tables

Details ISBN0198830262 Author Kannan M. Krishnan Publisher Oxford University Press Year 2021 ISBN-10 0198830262 ISBN-13 9780198830269 Format Paperback Language English Pages 880 Imprint Oxford University Press Place of Publication Oxford Country of Publication United Kingdom Publication Date 2021-05-07 UK Release Date 2021-05-07 NZ Release Date 2021-05-07 Illustrations 564 line drawings, halftones, and colour images Alternative 9780198830252 DEWEY 620.112 Audience Tertiary & Higher Education AU Release Date 2021-04-18 We've got this

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